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The Flat Display Mounting Interface (FDMI), also known as VESA Mounting Interface Standard (MIS) or colloquially as VESA mount, is a family of standards defined by the Video Electronics Standards Association for mounting flat panel monitors, televisions, and other displays to stands or wall mounts. [1]
VESA is an organization that manages the standards for mounting solutions. In 1997, VESA came up with a standard hole size and screwing pattern for flat panel screens, called Flat Display Mounting Interface (usually known as VESA mount), which is still valid today. Almost all monitor mounts follow this VESA standard in one form or another.
Snell & Wilcox SW2 and SW4 "Zone Plate" Test Chart (also referred to as Snell & Wilcox Test Pattern) were TV test cards introduced in the 1990s and used with NTSC, PAL and SDTV systems. [1] Popular versions of the test charts were made available on Laserdisc and DVD-Video, allowing home users and professionals to test and calibrate their equipment.
Rack with sample component sizes including an A/V half-rack unit. A rack unit (abbreviated U or RU) is a unit of measure defined as 1 + 3 ⁄ 4 inches (44.45 mm). [1] [2] It is most frequently used as a measurement of the overall height of 19-inch and 23-inch rack frames, as well as the height of equipment that mounts in these frames, whereby the height of the frame or equipment is expressed ...
Test cards typically contain a set of patterns to enable television cameras and receivers to be adjusted to show the picture correctly (see SMPTE color bars).Most modern test cards include a set of calibrated color bars which will produce a characteristic pattern of "dot landings" on a vectorscope, allowing chroma and tint to be precisely adjusted between generations of videotape or network feeds.
A precursor to the SMPTE test pattern was conceived by Norbert D. Larky (1927–2018) [5] [6] and David D. Holmes (1926–2006) [7] [8] of RCA Laboratories and first published in RCA Licensee Bulletin LB-819 on February 7, 1951. U.S. patent 2,742,525 Color Test Pattern Generator (now expired) was awarded on April 17, 1956, to Larky and Holmes. [9]
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