Search results
Results from the WOW.Com Content Network
Piezoresponse force microscopy is a technique which since its inception and first implementation by Güthner and Dransfeld [1] has steadily attracted more and more interest. This is due in large part to the many benefits and few drawbacks that PFM offers researchers in varying fields from ferroelectrics, semiconductors and even biology. [ 2 ]
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Photonic force microscope, an optical tweezer based method to measure forces in the range of several piconewtons; Piezoresponse force microscopy, a technique typically used to investigate and manipulate ferroelectric domains on nanoscale dimensions; Plasma-facing material, the material used to line the reactor vessel in a fusion power reactor
The so-called force curve is the graph of force (or more precisely, of cantilever deflection) versus the piezoelectric position on the Z axis. An ideal Hookean spring, for example, would display a straight diagonal force curve. Typically, the force curves observed in the force spectroscopy experiments consist of a contact (diagonal) region ...
Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
“There have been more than 100,” said an investigator who is part of the joint task force to solve the case. “The next move is to decide which ones are credible and which ones are not. But ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...