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Piezoresponse force microscopy is a technique which since its inception and first implementation by Güthner and Dransfeld [1] has steadily attracted more and more interest. This is due in large part to the many benefits and few drawbacks that PFM offers researchers in varying fields from ferroelectrics, semiconductors and even biology. [ 2 ]
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Photonic force microscope, an optical tweezer based method to measure forces in the range of several piconewtons; Piezoresponse force microscopy, a technique typically used to investigate and manipulate ferroelectric domains on nanoscale dimensions; Plasma-facing material, the material used to line the reactor vessel in a fusion power reactor
Photoconductive atomic force microscopy; Photon scanning microscopy; ... Piezoresponse force microscopy; Probe tip; S. Scanning capacitance microscopy;
The so-called force curve is the graph of force (or more precisely, of cantilever deflection) versus the piezoelectric position on the Z axis. An ideal Hookean spring, for example, would display a straight diagonal force curve. Typically, the force curves observed in the force spectroscopy experiments consist of a contact (diagonal) region ...
Nanoelectromechanics and piezoresponse force microscopy [ edit ] Kalinin has contributed to the field of nanoscale electromechanics , [ 6 ] exploring the coupling between electrical and mechanical phenomena on the nanoscale.
In 2001, an 18-year-old committed to a Texas boot camp operated by one of Slattery’s previous companies, Correctional Services Corp., came down with pneumonia and pleaded to see a doctor as he struggled to breathe.
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...