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Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales. Some common examples of microscopy techniques include: Optical ...
As such, many characterization techniques should ideally be linked to the desirable properties of the material such as strength, impermeability, thermal stability, and optical properties. [ 1 ] Characterization techniques are typically used to determine molecular mass , molecular structure, molecular morphology , thermal properties, and ...
Short title: Optical characterization in microelectronics manufacturing: Image title: To successfully construct semiconductor devices, the semiconductor industry must measure fundamental material parameters, especially when developing new materials; measure the quality of the material as it is grown; accurately determine the details of thin films, quantum wells, and other microstructures that ...
Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.
Materials Science and Engineering – An Introduction. London: John Wiley and Sons. ISBN 0-471-32013-7. Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press. ISBN 978-0-521-83199-4
Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [2] An instrument dedicated to performing such powder measurements is called a powder diffractometer.
The impulse excitation technique (IET) is a non-destructive material characterization technique to determine the elastic properties and internal friction of a material of interest. [1] It measures the resonant frequencies in order to calculate the Young's modulus , shear modulus , Poisson's ratio and internal friction of predefined shapes like ...
The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles.,. [1] Nanoparticles measure less than 100 nanometers in at least one of their external dimensions, and are often engineered for their unique properties.