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  2. Extended X-ray absorption fine structure - Wikipedia

    en.wikipedia.org/wiki/Extended_X-ray_absorption...

    XAS is an interdisciplinary technique and its unique properties, as compared to x-ray diffraction, have been exploited for understanding the details of local structure in: glass, amorphous and liquid systems; solid solutions; doping and ionic implantation of materials for electronics; local distortions of crystal lattices; organometallic compounds

  3. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.

  4. X-ray absorption fine structure - Wikipedia

    en.wikipedia.org/wiki/X-ray_absorption_fine...

    The XANES energy region [3] extends between the edge region and the EXAFS region over a 50-100 eV energy range around the core level x-ray absorption threshold. Before 1980 the XANES region was wrongly assigned to different final states: a) unoccupied total density of states, or b) unoccupied molecular orbitals (kossel structure) or c) unoccupied atomic orbitals or d) low energy EXAFS ...

  5. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.

  6. Wyckoff positions - Wikipedia

    en.wikipedia.org/wiki/Wyckoff_positions

    The Wyckoff positions are named after Ralph Wyckoff, an American X-ray crystallographer who authored several books in the field.His 1922 book, The Analytical Expression of the Results of the Theory of Space Groups, [3] contained tables with the positional coordinates, both general and special, permitted by the symmetry elements.

  7. Structure factor - Wikipedia

    en.wikipedia.org/wiki/Structure_factor

    The structure factor is a critical tool in the interpretation of scattering patterns (interference patterns) obtained in X-ray, electron and neutron diffraction experiments. Confusingly, there are two different mathematical expressions in use, both called 'structure factor'.

  8. R-factor (crystallography) - Wikipedia

    en.wikipedia.org/wiki/R-factor_(crystallography)

    In crystallography, the R-factor (sometimes called residual factor or reliability factor or the R-value or R Work) is a measure of the disagreement between the crystallographic model and the experimental X-ray diffraction data - lower the R value lower is the disagreement or better is the agreement.

  9. X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_spectroscopy

    Usually X-ray diffraction in spectrometers is achieved on crystals, but in Grating spectrometers, the X-rays emerging from a sample must pass a source-defining slit, then optical elements (mirrors and/or gratings) disperse them by diffraction according to their wavelength and, finally, a detector is placed at their focal points.