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Thinfilm – Web interface for calculating optical properties of thin films and multilayer materials (reflection & transmission coefficients, ellipsometric parameters Psi & Delta). Simple web interface for calculating single-interface reflection and refraction angles and strengths .
The overall reflection of a layer structure is the sum of an infinite number of reflections. The transfer-matrix method is based on the fact that, according to Maxwell's equations , there are simple continuity conditions for the electric field across boundaries from one medium to the next.
Time-resolved simulation of a pulse reflecting from a Bragg mirror. A distributed Bragg reflector (DBR) is a reflector used in waveguides, such as optical fibers.It is a structure formed from multiple layers of alternating materials with different refractive index, or by periodic variation of some characteristic (such as height) of a dielectric waveguide, resulting in periodic variation in the ...
A well-designed multilayer dielectric coating can provide a reflectivity of over 99% across the visible light spectrum. [1] Dielectric mirrors exhibit retardance as a function of angle of incidence and mirror design. [2] As shown in the GIF, the transmitted color shifts towards the blue with increasing angle of incidence.
Each optical element (surface, interface, mirror, or beam travel) is described by a 2 × 2 ray transfer matrix which operates on a vector describing an incoming light ray to calculate the outgoing ray. Multiplication of the successive matrices thus yields a concise ray transfer matrix describing the entire optical system.
Gas lasers using an external cavity (reflection by one or both mirrors outside the gain medium) generally seal the tube using windows tilted at Brewster's angle. This prevents light in the intended polarization from being lost through reflection (and reducing the round-trip gain of the laser) which is critical in lasers having a low round-trip ...
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
In the reflection, the higher energy ion (red) takes a longer path but arrives at the detector at the same time as the lower energy ion (blue) of the same mass. The idea of improving mass resolution in TOF MS by implementing the reflection of ions from a region with retarding electric field (the ion mirror) has been first proposed by Russian ...
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