Search results
Results from the WOW.Com Content Network
List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE. The following table is split into two groups based on whether it has a graphical visual interface or not.
The Bohnenberger electrometer, developed by J. G. F. von Bohnenberger from an invention by T. G. B. Behrens, [1] consists of a single gold leaf suspended vertically between the anode and cathode of a dry pile. Any charge imparted to the gold leaf causes it to move toward one or the other pole; thus, the sign of the charge as well as its ...
The Turner-Sclerometer test consists of measuring the amount of load required to make a scratch. [1] [2] In test a weighted diamond point is drawn, once forward and once backward, over the smooth surface of the material to be tested. The hardness number is the weight in grams required to produce a standard scratch.
Scratch hardness test or scratch test refers to any of a number of methods of measuring scratch hardness. Resistance to abrasion is less affected by surface variations than indentation methods. Scratch hardness is measured with a sclerometer. [1] Attempting to scratch a surface to test a material is a very old technique. [2]
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]
The industrial PC is a normal desktop computer packaged in 19-inch rack standards with sufficient PCI / PCIe slots for accommodating the Signal stimulator/sensing cards. This takes up the role of a controller in the ATE. Development of test applications and result storage is managed in this PC.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.