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The forward scattering of light makes the faint outer rings more visible. Forward scattering is the deflection of waves by small angles so that they continue to move in close to the same direction as before the scattering. It can occur with all types of waves, for instance light, ultraviolet radiation, X-rays as well as matter waves such as ...
Backscatter. In physics, backscatter (or backscattering) is the reflection of waves, particles, or signals back to the direction from which they came. It is usually a diffuse reflection due to scattering, as opposed to specular reflection as from a mirror, although specular backscattering can occur at normal incidence with a surface.
Electron-beam lithography (often abbreviated as e-beam lithography or EBL) is the practice of scanning a focused beam of electrons to draw custom shapes on a surface covered with an electron-sensitive film called a resist (exposing). [1] The electron beam changes the solubility of the resist, enabling selective removal of either the exposed or ...
The Mikheyev–Smirnov–Wolfenstein effect (often referred to as the matter effect) is a particle physics process which modifies neutrino oscillations in matter of varying density. The MSW effect is broadly analogous to the differential retardation of sound waves in density-variable media, however it also involves the propagation dynamics of ...
Energy level scheme of SHG process. Second-harmonic generation (SHG), also known as frequency doubling, is the lowest-order wave-wave nonlinear interaction that occurs in various systems, including optical, radio, atmospheric, and magnetohydrodynamic systems. [ 1 ] As a prototype behavior of waves, SHG is widely used, for example, in doubling ...
In photography, backscatter (also called near-camera reflection [1]) is an optical phenomenon resulting in typically circular artifacts on an image, due to the camera's flash being reflected from unfocused motes of dust, water droplets, or other particles in the air or water.
Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science.Sometimes referred to as high-energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions (typically protons or alpha particles) impinging on a sample.
The Klein–Nishina formula was derived in 1928 by Oskar Klein and Yoshio Nishina, and was one of the first results obtained from the study of quantum electrodynamics. Consideration of relativistic and quantum mechanical effects allowed development of an accurate equation for the scattering of radiation from a target electron.