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  2. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    A transmission electron microscope from 2002 An image of an ant in a scanning electron microscope An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing ...

  3. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    Operating principle of a transmission electron microscope. Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid.

  4. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  5. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  6. Electron-beam technology - Wikipedia

    en.wikipedia.org/wiki/Electron-beam_technology

    An electron microscope uses a controlled beam of electrons to illuminate a specimen and produce a magnified image. Two common types are the scanning electron microscope (SEM) and the transmission electron microscope (TEM).

  7. Electron optics - Wikipedia

    en.wikipedia.org/wiki/Electron_optics

    Electron optics is a mathematical framework for the calculation of electron trajectories in the presence of electromagnetic fields. The term optics is used because magnetic and electrostatic lenses act upon a charged particle beam similarly to optical lenses upon a light beam .

  8. Contrast transfer function - Wikipedia

    en.wikipedia.org/wiki/Contrast_transfer_function

    The effect of the contrast transfer function can be seen in the alternating light and dark rings (Thon rings), which show the relation between contrast and spatial frequency. The contrast transfer function (CTF) mathematically describes how aberrations in a transmission electron microscope (TEM) modify the image of a sample.

  9. Point spread function - Wikipedia

    en.wikipedia.org/wiki/Point_spread_function

    By virtue of the linearity property of optical non-coherent imaging systems, i.e., . Image(Object 1 + Object 2) = Image(Object 1) + Image(Object 2). the image of an object in a microscope or telescope as a non-coherent imaging system can be computed by expressing the object-plane field as a weighted sum of 2D impulse functions, and then expressing the image plane field as a weighted sum of the ...

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