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Product lifetimes can be modelled using extant data from surveys with the application of probability and other statistical concepts (e.g. distributions). [12] [22] One of the earliest attempts to estimate product lifetimes was undertaken by Pennock and Jaeger [23] who utilised actuarial methods to measure the Service life of household goods for ...
Given a component database calibrated with field failure data that is reasonably accurate, [1] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness for a given application.
Government and commercial failure rate data Handbooks of failure rate data for various components are available from government and commercial sources. MIL-HDBK-217F, Reliability Prediction of Electronic Equipment, is a military standard that provides failure rate data for many military electronic components. Several failure rate data sources ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
In the later life of the product, the failure rate increases due to wearout. Many electronic consumer product life cycles follow the bathtub curve. [ 1 ] It is difficult to know where a product is along the bathtub curve, or even if the bathtub curve is applicable to a certain product without large amounts of products in use and associated ...
Electrical machines are usually designed with an average temperature below the rated hot-spot temperature to allow for acceptable life. Insulation does not suddenly fail if the hot-spot temperature is reached, but useful operating life declines rapidly; a rule of thumb is a halving of life for every 10 °C temperature increase.
The difference between service life and predicted life is most clear when considering mission time and reliability in comparison to MTBF and service life. For example, a missile system can have a mission time of less than one minute, service life of 20 years, active MTBF of 20 minutes, dormant MTBF of 50 years, and reliability of 99.9999%.
The design life of a component or product is the period of time during which the item is expected by its designers to work within its specified parameters; in other words, the life expectancy of the item. It is not always the actual length of time between placement into service of a single item and that item's onset of wearout.