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  2. Fault detection and isolation - Wikipedia

    en.wikipedia.org/wiki/Fault_detection_and_isolation

    Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...

  3. Template:Infobox fault - Wikipedia

    en.wikipedia.org/wiki/Template:Infobox_fault

    Etymology {{{namedfor}}} Named by {{{namedby}}} Year defined {{{yeardef}}} Location {{{location}}} Coordinates: Country {{{country}}} Region {{{region}}} State

  4. Science fair - Wikipedia

    en.wikipedia.org/wiki/Science_fair

    A science fair or engineering fair is an event hosted by a school that offers students the opportunity to experience the practices of science and engineering for themselves. In the United States, the Next Generation Science Standards makes experiencing the practices of science and engineering one of the three pillars of science education.

  5. Root cause analysis - Wikipedia

    en.wikipedia.org/wiki/Root_cause_analysis

    In science and engineering, root cause analysis (RCA) is a method of problem solving used for identifying the root causes of faults or problems. [1] It is widely used in IT operations, manufacturing, telecommunications, industrial process control, accident analysis (e.g., in aviation, [2] rail transport, or nuclear plants), medical diagnosis, the healthcare industry (e.g., for epidemiology ...

  6. Failure analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_analysis

    Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective actions or liability.. According to Bloch and Geitner, ”machinery failures reveal a reaction chain of cause and effect… usually a deficiency commonly referred to as the symptom…”

  7. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

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  9. Fault reporting - Wikipedia

    en.wikipedia.org/wiki/Fault_reporting

    Fault reporting is a maintenance concept that increases operational availability and that reduces operating cost by three mechanisms: Reduce labor-intensive diagnostic evaluation; Eliminate diagnostic testing down-time; Provide notification to management for degraded operation; That is a prerequisite for condition-based maintenance. [1]