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Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...
Automatic test equipment; Automatic test switching; ... Digital delay generator; ... List of power engineering measuring equipment;
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Then, a periodic test will assure that the device has not become unsafe since the POST. Safety-critical devices normally define a "safety interval", a period of time too short for injury to occur. The self test of the most critical functions normally is completed at least once per safety interval. The periodic test is normally a subset of the POST.