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  2. Automatic test switching - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_switching

    Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...

  3. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...

  4. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  5. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...

  6. RF switch - Wikipedia

    en.wikipedia.org/wiki/RF_switch

    An RF switch or microwave switch is a device to route high frequency signals through transmission paths. RF ( radio frequency ) and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT).

  7. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    The model assumes one line or node in the digital circuit is stuck at logic high or logic low. When a line is stuck, it is called a fault. Digital circuits can be divided into: Gate level or combinational circuits which contain no storage (latches and/or flip flops) but only gates like NAND, OR, XOR, etc. Sequential circuits which contain storage.

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  9. Digital electronics - Wikipedia

    en.wikipedia.org/wiki/Digital_electronics

    Additionally, where clocked digital systems interface to analog systems or systems that are driven from a different clock, the digital system can be subject to metastability where a change to the input violates the setup time for a digital input latch. Since digital circuits are made from analog components, digital circuits calculate more ...