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Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...
An RF switch or microwave switch is a device to route high frequency signals through transmission paths. RF ( radio frequency ) and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT).
The model assumes one line or node in the digital circuit is stuck at logic high or logic low. When a line is stuck, it is called a fault. Digital circuits can be divided into: Gate level or combinational circuits which contain no storage (latches and/or flip flops) but only gates like NAND, OR, XOR, etc. Sequential circuits which contain storage.
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Additionally, where clocked digital systems interface to analog systems or systems that are driven from a different clock, the digital system can be subject to metastability where a change to the input violates the setup time for a digital input latch. Since digital circuits are made from analog components, digital circuits calculate more ...