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Battery leakage is the escape of chemicals, such as electrolytes, within an electric battery due to generation of pathways to the outside environment caused by factory or design defects, excessive gas generation, or physical damage to the battery.
Memory effect, also known as battery effect, lazy battery effect, or battery memory, is an effect observed in nickel-cadmium rechargeable batteries that causes them to hold less charge. [ 1 ] [ 2 ] It describes the situation in which nickel-cadmium batteries gradually lose their maximum energy capacity if they are repeatedly recharged after ...
Thermal expansion produces mechanical stresses that may cause material fatigue, especially when the thermal expansion coefficients of the materials are different. Humidity and aggressive chemicals can cause corrosion of the packaging materials and leads, potentially breaking them and damaging the inside parts, leading to electrical failure.
It is referred to as non-volatile memory or NVRAM because, after the system loses power, it does retain state by virtue of the CMOS battery. When the battery fails, BIOS settings are reset to their defaults. The battery can also be used to power a real time clock (RTC) and the RTC, NVRAM and battery may be integrated into a single component.
This corrosion would occur regardless of whether or not the battery was providing power, making shelf life an important consideration with silver oxide batteries. Sony started producing the first mercury-free silver oxide batteries in 2004. Regulation in the European Union now dictates that all batteries be virtually mercury-free. [13]
Software rot (bit rot, code rot, software erosion, software decay, or software entropy) is the degradation, deterioration, or loss of the use or performance of software over time.
Leakage may also mean an unwanted transfer of energy from one circuit to another. For example, magnetic lines of flux will not be entirely confined within the core of a power transformer; another circuit may couple to the transformer and receive some leaked energy at the frequency of the electric mains, which will cause audible hum in an audio application.
Hardware and software failure are the two main causes for data loss. Background radiation, head crashes, and aging or wear of the storage device fall into the former category, while software failure typically occurs due to bugs in the code. Cosmic rays cause most soft errors in DRAM. [1]