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Reflectance and transmittance measurements of the uncoated glass substrate were needed in order to determine the previously unknown n(λ) and k(λ) spectra of the glass. The reflectance and transmittance of ITO deposited on the same glass substrate were then measured simultaneously, and analyzed using the Forouhi–Bloomer equations.
If R 1 represents a clean freshly prepared surface (e.g., after a cleavage in vacuum) and R 2 the same sample after the exposure to hydrogen or oxygen contaminants, the ΔR/R spectrum can be related to features of the clean surface (e.g., surface states); [2] if R 1 is the reflectivity spectrum of a sample covered by an organic film (even if ...
An illustration of geometrical parameters in the visible-near Infrared (VNIR) reflectance spectrum of montmorillonite, a clay mineral. Modified from Clark et al., 2007. [15] The analysis of absorption features in a reflectance spectrum typically looks into the position (P), depth (D), and width (W) of absorption bands across a certain ...
Diffuse reflectance spectroscopy, or diffuse reflection spectroscopy, is a subset of absorption spectroscopy.It is sometimes called remission spectroscopy.Remission is the reflection or back-scattering of light by a material, while transmission is the passage of light through a material.
For layered and finite media, according to the CIE, [citation needed] reflectivity is distinguished from reflectance by the fact that reflectivity is a value that applies to thick reflecting objects. [6] When reflection occurs from thin layers of material, internal reflection effects can cause the reflectance to vary with surface thickness.
Compared to traditional porosimeters, Ellipsometer porosimeters are well suited to very thin film pore size and pore size distribution measurement. Film porosity is a key factor in silicon based technology using low-κ materials, organic industry (encapsulated organic light-emitting diodes) as well as in the coating industry using sol gel ...
These parameters approximate amorphous silicon. [1] The Forouhi–Bloomer model is a mathematical formula for the frequency dependence of the complex-valued refractive index. The model can be used to fit the refractive index of amorphous and crystalline semiconductor and dielectric materials at energies near and greater than their optical band gap.
Spectroscopy is a branch of science concerned with the spectra of electromagnetic radiation as a function of its wavelength or frequency measured by spectrographic equipment, and other techniques, in order to obtain information concerning the structure and properties of matter. [4]