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While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.
The system under test may be composed of electromechanical or computer hardware, or software, or hardware with embedded software, or hardware/software with human-in-the-loop testing. SIT is typically performed on a larger integrated system of components and subassemblies that have previously undergone subsystem testing.
However, if the test cases and their results are not recorded properly, the entire integration process will be more complicated and may prevent the testing team from achieving the goal of integration testing. In bottom-up testing, the lowest level components are tested first, and are then used to facilitate the testing of higher level components.
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.
In computer programming, assembly language (alternatively assembler language [1] or symbolic machine code), [2] [3] [4] often referred to simply as assembly and commonly abbreviated as ASM or asm, is any low-level programming language with a powerful correspondence between the instructions in the language and the architecture's machine code instructions. [5]
Unit testing, a.k.a. component or module testing, is a form of software testing by which isolated source code is tested to validate expected behavior. [ 1 ] Unit testing describes tests that are run at the unit-level to contrast testing at the integration or system level.
Burn-in is the process by which components of a system are exercised before being placed in service (and often, before the system being completely assembled from those components). This testing process will force certain failures to occur under supervised conditions so an understanding of load capacity of the product can be established.
Black-box testing is the software analog to FTC. At the end of the system development, a functional test verifies that the requirements of the system are met. Component Test Cases (CTC) are a physical analog to White-box testing. CTC verify that components satisfy the allocated FRs and ICs.