enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.

  3. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.

  4. Clay mineral X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Clay_Mineral_X-Ray_Diffraction

    Typically, powder X-ray diffraction (XRD) is an average of randomly oriented microcrystals that should equally represent all crystal orientation if a large enough sample is present. X-rays are directed at the sample while slowly rotated that produce a diffraction pattern that shows intensity of x-rays collected at different angles. Randomly ...

  5. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...

  6. Wide-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Wide-angle_X-ray_scattering

    It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography.

  7. Scientists Finally Solved the Mystery of How the Mayan ...

    www.aol.com/lifestyle/scientists-finally-solved...

    The Mayan calendar’s 819-day cycle has confounded scholars for decades, but new research shows how it matches up to planetary cycles over a 45-year span

  8. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.

  9. Best Buy broadly misses earnings estimates as consumers pull ...

    www.aol.com/finance/best-buy-expected-see...

    Prior to the earnings release, analysts had expected new technologies to boost Best Buy's results. "The company should see a return to growth in the first half of 2025, following many consecutive ...