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The formula represents the liquid-drop model proposed by George Gamow, [1] which can account for most of the terms in the formula and gives rough estimates for the values of the coefficients. It was first formulated in 1935 by German physicist Carl Friedrich von Weizsäcker , [ 2 ] and although refinements have been made to the coefficients ...
Chilton–Colburn J-factor analogy (also known as the modified Reynolds analogy [1]) is a successful and widely used analogy between heat, momentum, and mass transfer.The basic mechanisms and mathematics of heat, mass, and momentum transport are essentially the same.
Charge transfer coefficient, and symmetry factor (symbols α and β, respectively) are two related parameters used in description of the kinetics of electrochemical reactions. They appear in the Butler–Volmer equation and related expressions.
'drop') is one of the most common methods for measuring surface tension. The principle is to measure the weight of drops of a fluid of interest falling from a capillary glass tube, and thereby calculate the surface tension of the fluid. We can determine the weight of the falling drops by counting them.
In chemistry, ion transport number, also called the transference number, is the fraction of the total electric current carried in an electrolyte by a given ionic species i: [1] = Differences in transport number arise from differences in electrical mobility.
In condensed matter physics and crystallography, the static structure factor (or structure factor for short) is a mathematical description of how a material scatters incident radiation. The structure factor is a critical tool in the interpretation of scattering patterns ( interference patterns ) obtained in X-ray , electron and neutron ...
The Kovats index applies to organic compounds.The method interpolates peaks between bracketing n-alkanes.The Kovats index of n-alkanes is 100 times their carbon number, e.g. the Kovats index of n-butane is 400.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.