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  2. Wyckoff positions - Wikipedia

    en.wikipedia.org/wiki/Wyckoff_positions

    The Wyckoff positions are named after Ralph Wyckoff, an American X-ray crystallographer who authored several books in the field.His 1922 book, The Analytical Expression of the Results of the Theory of Space Groups, [3] contained tables with the positional coordinates, both general and special, permitted by the symmetry elements.

  3. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    This is useful if the sample is too thick for X-rays to transmit through it. The diffracting planes in the crystal are determined by knowing that the normal to the diffracting plane bisects the angle between the incident beam and the diffracted beam. A Greninger chart can be used [30] to interpret the back reflection Laue photograph.

  4. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    Women have written many textbooks and research papers in the field of X-ray crystallography. For many years Lonsdale edited the International Tables for Crystallography, which provide information on crystal lattices, symmetry, and space groups, as well as mathematical, physical and chemical data on structures.

  5. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    is the mean size of the ordered (crystalline) domains, which may be smaller or equal to the grain size, which may be smaller or equal to the particle size; is a dimensionless shape factor, with a value close to unity. The shape factor has a typical value of about 0.9, but varies with the actual shape of the crystallite;

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.

  7. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography, often abbreviated as XRD-CT, typically refers to the technique invented by Harding et al. [1] which assumes that the acquired data are powder diffraction data. For this reason, it has also been mentioned as powder diffraction computed tomography [ 7 ] and diffraction scattering computed tomography (DSCT ...

  8. Illite crystallinity - Wikipedia

    en.wikipedia.org/wiki/Illite_crystallinity

    The focus of an illite crystallinity XRD plot is the main peak. Width of the peak at one half of its height is measured and this angle (recorded with units of ∆ °2θ), [1] can be plotted on a chart with metamorphic zones and facies like the one in figure 1. If the illite crystallinity values fall in the 0-0.25 °2θ range, it corresponds ...

  9. R-factor (crystallography) - Wikipedia

    en.wikipedia.org/wiki/R-factor_(crystallography)

    Random experimental errors in the data contribute to even for a perfect model, and these have more leverage when the data are weak or few, such as for a low-resolution data set. Model inadequacies such as incorrect or missing parts and unmodeled disorder are the other main contributors to R {\displaystyle R} , making it useful to assess the ...

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