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  2. Wyckoff positions - Wikipedia

    en.wikipedia.org/wiki/Wyckoff_positions

    The Wyckoff positions are named after Ralph Wyckoff, an American X-ray crystallographer who authored several books in the field.His 1922 book, The Analytical Expression of the Results of the Theory of Space Groups, [3] contained tables with the positional coordinates, both general and special, permitted by the symmetry elements.

  3. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.

  4. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-rays are generally filtered (by use of X-ray filters) to a single wavelength (made monochromatic) and collimated to a single direction before they are allowed to strike the crystal. The filtering not only simplifies the data analysis, but also removes radiation that degrades the crystal without contributing useful information.

  5. Clay mineral X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Clay_Mineral_X-Ray_Diffraction

    Typically, powder X-ray diffraction (XRD) is an average of randomly oriented microcrystals that should equally represent all crystal orientation if a large enough sample is present. X-rays are directed at the sample while slowly rotated that produce a diffraction pattern that shows intensity of x-rays collected at different angles. Randomly ...

  6. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    The data can be corrected for self-absorption artefacts using an X-ray absorption-contrast CT scan of the same sample. If the solid-state chemistry of the sample is changing during the XRD-CT scan, then other data acquisition approaches can be employed that can improve the temporal resolution of the method, such as the interlaced approach [13] [14]

  7. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.

  8. X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_spectroscopy

    These counts may be plotted on a curve by an appropriate display unit. The characteristic X-rays come out at specific angles, and since the angular position for every X-ray spectral line is known and recorded, it is easy to find the sample's composition. A chart for a scan of a Molybdenum specimen is shown in Fig. 2.

  9. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    is the mean size of the ordered (crystalline) domains, which may be smaller or equal to the grain size, which may be smaller or equal to the particle size; is a dimensionless shape factor, with a value close to unity. The shape factor has a typical value of about 0.9, but varies with the actual shape of the crystallite;