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  2. List of moments of inertia - Wikipedia

    en.wikipedia.org/wiki/List_of_moments_of_inertia

    List of moments of inertia. Moment of inertia, denoted by I, measures the extent to which an object resists rotational acceleration about a particular axis; it is the rotational analogue to mass (which determines an object's resistance to linear acceleration). The moments of inertia of a mass have units of dimension ML 2 ( [mass] × [length] 2).

  3. List of second moments of area - Wikipedia

    en.wikipedia.org/wiki/List_of_second_moments_of_area

    The second moment of area, also known as area moment of inertia, is a geometrical property of an area which reflects how its points are distributed with respect to an arbitrary axis. The unit of dimension of the second moment of area is length to fourth power, L 4, and should not be confused with the mass moment of inertia.

  4. Transistor count - Wikipedia

    en.wikipedia.org/wiki/Transistor_count

    The transistor count is the number of transistors in an electronic device (typically on a single substrate or silicon die).It is the most common measure of integrated circuit complexity (although the majority of transistors in modern microprocessors are contained in cache memories, which consist mostly of the same memory cell circuits replicated many times).

  5. American wire gauge - Wikipedia

    en.wikipedia.org/wiki/American_wire_gauge

    American wire gauge. American Wire Gauge (AWG) is a logarithmic stepped standardized wire gauge system used since 1857, predominantly in North America, for the diameters of round, solid, nonferrous, electrically conducting wire. Dimensions of the wires are given in ASTM standard B 258. [1] The cross-sectional area of each gauge is an important ...

  6. 22 nm process - Wikipedia

    en.wikipedia.org/wiki/22_nm_process

    The "22 nm" node is the process step following 32 nm in CMOS MOSFET semiconductor device fabrication. The typical half-pitch (i.e., half the distance between identical features in an array) for a memory cell using the process is around 22 nm. [citation needed] It was first demonstrated by semiconductor companies for use in RAM memory in 2008.

  7. Current density - Wikipedia

    en.wikipedia.org/wiki/Current_density

    In electromagnetism, current density is the amount of charge per unit time that flows through a unit area of a chosen cross section. [1] The current density vector is defined as a vector whose magnitude is the electric current per cross-sectional area at a given point in space, its direction being that of the motion of the positive charges at this point.

  8. Point group - Wikipedia

    en.wikipedia.org/wiki/Point_group

    Point groups are used to describe the symmetries of geometric figures and physical objects such as molecules. Each point group can be represented as sets of orthogonal matrices M that transform point x into point y according to y = Mx. Each element of a point group is either a rotation (determinant of M = 1), or it is a reflection or improper ...

  9. Vickers hardness test - Wikipedia

    en.wikipedia.org/wiki/Vickers_hardness_test

    The Vickers test can be used for all metals and has one of the widest scales among hardness tests. The unit of hardness given by the test is known as the Vickers Pyramid Number (HV) or Diamond Pyramid Hardness (DPH). The hardness number can be converted into units of pascals, but should not be confused with pressure, which uses the same units.