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Refraction at interface. Many materials have a well-characterized refractive index, but these indices often depend strongly upon the frequency of light, causing optical dispersion. Standard refractive index measurements are taken at the "yellow doublet" sodium D line, with a wavelength (λ) of 589 nanometers.
Light propagation in absorbing materials can be described using a complex-valued refractive index. [2] The imaginary part then handles the attenuation, while the real part accounts for refraction. For most materials the refractive index changes with wavelength by several percent across the visible spectrum.
The distinction is irrelevant for an unattenuated wave, but becomes relevant in some cases below. For example, there are two definitions of complex refractive index, one with a positive imaginary part and one with a negative imaginary part, derived from the two different conventions. [2] The two definitions are complex conjugates of each other.
The Forouhi–Bloomer model is a mathematical formula for the frequency dependence of the complex-valued refractive index. The model can be used to fit the refractive index of amorphous and crystalline semiconductor and dielectric materials at energies near and greater than their optical band gap.
Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an ...
A. R. Forouhi and I. Bloomer deduced dispersion equations for the refractive index, n, and extinction coefficient, k, which were published in 1986 [1] and 1988. [2] The 1986 publication relates to amorphous materials, while the 1988 publication relates to crystalline.
A negative-index metamaterial causes light to refract, or bend, differently than in more common positive-index materials such as glass lenses. Negative-index metamaterial or negative-index material (NIM) is a metamaterial whose refractive index for an electromagnetic wave has a negative value over some frequency range.
The Tauc–Lorentz model is a mathematical formula for the frequency dependence of the complex-valued relative permittivity, sometimes referred to as the dielectric function. The model has been used to fit the complex refractive index of amorphous semiconductor materials at frequencies greater than their optical band gap.