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Reflection positions and intensities of known crystal phases, mostly from X-ray diffraction data, are stored, as d-I data pairs, in the Powder Diffraction File database. The list of d-I data pairs is highly characteristic of a crystal phase and, thus, suitable for the identification, also called ‘fingerprinting’, of crystal phases. [16]
General 3D mathematics with modelling and visualization of geoscience data ModelGeo AS Free for non-profit use Windows C++, TCL: Originally a petroleum geology program, reads all common geology and geophysics data formats ParaViewGeo [22] Geoscience extension of ParaView Includes readers and filters Kitware ParaView, Objectivity Originally ...
Origin Workbook with sparklines above data columns; this allows a quick glance of the data without plotting them. Origin is primarily a GUI software with a spreadsheet front end. Unlike popular spreadsheets like Excel, Origin's worksheet is column oriented. Each column has associated attributes like name, units and other user definable labels.
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [ 3 ] X-ray standing waves , another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry.
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