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Rectifier diodes (semiconductor or tube/valve) may have several voltage ratings, such as the peak inverse voltage (PIV) across the diode, and the maximum RMS input voltage to the rectifier circuit (which will be much less). Many small-signal transistors need to have any breakdown currents limited to much lower values to avoid excessive heating.
For experimental characterization, a distinction must be made between contact resistance evaluation in two-electrode systems (for example, diodes) and three-electrode systems (for example, transistors). In two-electrode systems, specific contact resistivity is experimentally defined as the slope of the I–V curve at V = 0:
Bridge rectifier (four diodes in a package) often changed to "D" for diode BT, BAT: Battery or battery holder: often shortened to "B" C: Capacitor: CB: Circuit breaker: CN: Capacitor network: may be simplified to "C" for capacitor D, CR: Diode (all types, including LED), thyristor "D" is preferred for various types of diodes DL: Delay line: DN ...
Diode–transistor logic (DTL) is a class of digital circuits that is the direct ancestor of transistor–transistor logic. It is called so because the logic gating functions AND and OR are performed by diode logic , while logical inversion (NOT) and amplification (providing signal restoration) is performed by a transistor (in contrast with ...
Diode circuit implementing AND in active-high logic. Note: in analog implementation exact output currents will be different from +5V supply. This circuit mirrors the previous gate: the diodes are reversed so that each input connects to the cathode of a diode and all anodes are connected together to the output, which has a pull-up resistor.
A circuit tester is used to check whether a transistor which has previously been performing properly in a circuit is still operational. The transistor's ability to "amplify" is taken as a rough index of its performance. This type of tester indicates to a technician whether the transistor is dead or still operative. The advantage of this tester ...
The discontinuity caused by negative resistance devices (such as tunnel diodes) can also be seen. This is a method for finding electrically damaged pins on integrated circuit devices. [2] For three-terminal devices (such as transistors) a connection to the control terminal of the device being tested is used, such as the Base or Gate terminal ...
A transient-voltage-suppression diode can respond to over-voltages faster than other common over-voltage protection components such as varistors or gas discharge tubes. The actual clamping occurs in roughly one picosecond, but in a practical circuit the inductance of the wires leading to the device imposes a higher limit. This makes transient ...
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