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The charged-device model (CDM) is a model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is an alternative to the human-body model (HBM). Devices that are classified according to CDM are exposed to a charge at a standardized voltage level, and then tested for survival.
An internationally widely used standard is JEDEC standard JS-001. HBM is used primarily for manufacturing environments to quantify an integrated circuit to survive the manufacturing process. A similar standard, IEC 61000-4-2, is used for system level testing and quantifies protection levels for a real world ESD event in an uncontrolled environment.
JEDEC has over 300 members, including some of the world's largest computer companies. Its scope and past activities includes standardization of part numbers, defining an electrostatic discharge (ESD) standard, and leadership in the lead-free manufacturing transition. [1]
One of the most widely used models is defined in the JEDEC 22-A114-B standard, which specifies a 100 picofarad capacitor and a 1,500 ohm resistor. Other similar standards are MIL-STD-883 Method 3015, and the ESD Association's ESD STM5.1.
IEC 61000-4-2 is the International Electrotechnical Commission's immunity standard on electrostatic discharge (ESD). The publication is one of the basic EMC standards of the IEC 61000–4 series. The European equivalent of the standard is called EN 61000-4-2. The current version of the IEC standard is the second edition dated 2008-12-09. [1]
This category collects standards and components that have been standardized by JEDEC Solid State Technology Association. Pages in category "JEDEC standards" The following 11 pages are in this category, out of 11 total.
Symbol for an ESD protection device – EPA Alternate warning symbol Symbol of an ESD grounding point for all components. An electrostatic-sensitive device (often abbreviated ESD) is any component (primarily electrical) which can be damaged by common static charges which build up on people, tools, and other non-conductors or semiconductors. [1]
In electrical engineering, transmission-line pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 of Pulse Generators , Vol. 5 of the MIT Radiation Lab Series.