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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    Magnification in an SEM can be controlled over a range of about 6 orders of magnitude from about 10 to 3,000,000 times. [28] Unlike optical and transmission electron microscopes, image magnification in an SEM is not a function of the power of the objective lens.

  3. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    The aperture function cuts off beams scattered above a certain critical angle (given by the objective pole piece for ex), thus effectively limiting the attainable resolution. However it is the envelope function E(u) which usually dampens the signal of beams scattered at high angles, and imposes a maximum to the transmitted spatial frequency ...

  4. Transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    For a 200 kV microscope, with partly corrected spherical aberrations ("to the third order") and a C s value of 1 μm, [107] a theoretical cut-off value might be 1/q max = 42 pm. [39] The same microscope without a corrector would have C s = 0.5 mm and thus a 200 pm cut-off. [107]

  5. Transmission electron microscopy DNA sequencing - Wikipedia

    en.wikipedia.org/wiki/Transmission_electron...

    The electron microscope can achieve a resolution of up to 100 picometers, allowing eukaryotic cells, prokaryotic cells, viruses, ribosomes, and even single atoms to be visualized (note the logarithmic scale). Transmission electron microscopy DNA sequencing is a single-molecule sequencing technology that uses transmission electron microscopy ...

  6. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    Reproduction of an early electron microscope constructed by Ernst Ruska in the 1930s. Many developments laid the groundwork of the electron optics used in microscopes. [2] One significant step was the work of Hertz in 1883 [3] who made a cathode-ray tube with electrostatic and magnetic deflection, demonstrating manipulation of the direction of an electron beam.

  7. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A low-voltage electron microscope (LVEM) is an electron microscope that is designed to operate at relatively low electron accelerating voltages of between 0.5 and 30 kV. Some LVEMs can function as an SEM, a TEM, and a STEM in a single compact instrument.

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