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Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales. Some common examples of microscopy techniques include: Optical ...
Polymer characterization is the analytical branch of polymer science. ... Sample preparation, including chain orientation within the sample, for tensile tests ...
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
Just as in chemistry, the characteristic property of a material will serve to identify a sample, or in the study of materials, structures and properties will determine characterization, in mathematics there is a continual effort to express properties that will distinguish a desired feature in a theory or system. Characterization is not unique ...
A secondary ion mass spectrometer consists of (1) a primary ion gun generating the primary ion beam, (2) a primary ion column, accelerating and focusing the beam onto the sample (and in some devices an opportunity to separate the primary ion species by Wien filter or to pulse the beam), (3) high vacuum sample chamber holding the sample and the ...
In order to escape from the sample, a photoelectron must travel through the sample. Photo-emitted electrons can undergo inelastic collisions, recombination, excitation of the sample, recapture or trapping in various excited states within the material, all of which can reduce the number of escaping photoelectrons.
Modern simultaneous CHNS combustion analyzer. Elemental analysis is a process where a sample of some material (e.g., soil, waste or drinking water, bodily fluids, minerals, chemical compounds) is analyzed for its elemental and sometimes isotopic composition.
A vibrating-sample magnetometer (VSM) (also referred to as a Foner magnetometer) is a scientific instrument that measures magnetic properties based on Faraday’s Law of Induction. Simon Foner at MIT Lincoln Laboratory invented VSM in 1955 and reported it in 1959. [ 1 ]