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  2. Time of flight - Wikipedia

    en.wikipedia.org/wiki/Time_of_flight

    Time of flight (ToF) is the measurement of the time taken by an object, particle or wave (be it acoustic, electromagnetic, etc.) to travel a distance through a medium. This information can then be used to measure velocity or path length, or as a way to learn about the particle or medium's properties (such as composition or flow rate).

  3. Timeline of microscope technology - Wikipedia

    en.wikipedia.org/wiki/Timeline_of_microscope...

    This technology is a predecessor to today's widely used confocal laser scanning microscope. 1967: Erwin Wilhelm Müller adds time-of-flight spectroscopy to the field ion microscope, making the first atom probe and allowing the chemical identification of each individual atom.

  4. Atom probe - Wikipedia

    en.wikipedia.org/wiki/Atom_probe

    Thus for an ion which traverses a 1 m flight path, across a time of 2000 ns, given an initial accelerating voltage of 5000 V (V in Si units is kg.m^2.s^-3.A^-1) and noting that one amu is 1×10 −27 kg, the mass-to-charge ratio (more correctly the mass-to-ionisation value ratio) becomes ~3.86 amu/charge. The number of electrons removed, and ...

  5. Electron spectrometer - Wikipedia

    en.wikipedia.org/wiki/Electron_spectrometer

    Electron spectrometers may determine electron energy based on time of flight, retarding potential (effectively a high-pass filter), resonant collision or curvature in a deflecting field (magnetic or electric).

  6. Scanning acoustic microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_acoustic_microscope

    The `time of flight' of the pulse is defined as the time taken for it to be emitted by an acoustic source, scattered by an object and received by the detector, which is usually coincident with the source. The time of flight can be used to determine the distance of the inhomogeneity from the source given knowledge of the speed through the medium.

  7. Secondary ion mass spectrometry - Wikipedia

    en.wikipedia.org/wiki/Secondary_ion_mass...

    The time of flight mass analyzer separates the ions in a field-free drift path according to their velocity. Since all ions possess the same kinetic energy the velocity and therefore time of flight varies according to mass. It requires pulsed secondary ion generation using either a pulsed primary ion gun or a pulsed secondary ion extraction.

  8. The 3 Most Overpriced Cities in America, According to Gen Z ...

    www.aol.com/3-most-overpriced-cities-america...

    Affordability is becoming a growing challenge for younger generations. Although they're often drawn to vibrant cities for their career opportunities and lifestyle perks, high housing costs make ...

  9. Time-of-flight mass spectrometry - Wikipedia

    en.wikipedia.org/wiki/Time-of-flight_mass...

    The velocity of the charged particle after acceleration will not change since it moves in a field-free time-of-flight tube. The velocity of the particle can be determined in a time-of-flight tube since the length of the path (d) of the flight of the ion is known and the time of the flight of the ion (t) can be measured using a transient digitizer or time to digital converter.