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Form the product C 2 ( R 1 + R 2). Select capacitor C 1, replace it by a test voltage V X, and replace C 2 by an open circuit. Then the resistance seen by the test voltage is found using the circuit in the right panel of Figure 1 and is simply V X / I X = R 1. Form the product C 1 R 1. Add these terms. In effect, it is as though each capacitor ...
The open-circuit test, or no-load test, is one of the methods used in electrical engineering to determine the no-load impedance in the excitation branch of a transformer. The no load is represented by the open circuit, which is represented on the right side of the figure as the "hole" or incomplete part of the circuit.
A different form of short-circuit testing is done to assess the mechanical strength of the transformer windings, and their ability to withstand the high forces produced if an energized transformer experiences a short-circuit fault. Currents during such events can be several times the normal rated current.
It is also known as short-circuit test (because it is the mechanical analogy of a transformer short-circuit test), [1] locked rotor test or stalled torque test. [2] From this test, short-circuit current at normal voltage , power factor on short circuit, total leakage reactance , and starting torque of the motor can be found.
The surge is defined by the Combination Wave Generator's open-circuit voltage and short-circuit current waveforms, characterized by front time, duration, and peak values. With an open circuit output, the surge voltage is a double exponential pulse in the form of k ( e − α t − e − β t ) {\displaystyle k(e^{-\alpha t}-e^{-\beta t})} .
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A diagram with multiple synchronous machine curves; open-circuit saturation curve is the leftmost one The open-circuit saturation curve (also open-circuit characteristic, OCC) of a synchronous generator is a plot of the output open circuit voltage as a function of the excitation current or field.
A resistor removed from a high voltage tube circuit shows damage from voltaic arcing on the resistive metal oxide layer. Resistors can fail open or short, alongside their value changing under environmental conditions and outside performance limits. Examples of resistor failures include: Manufacturing defects causing intermittent problems.