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  2. Failure detector - Wikipedia

    en.wikipedia.org/wiki/Failure_detector

    In a distributed computing system, a failure detector is a computer application or a subsystem that is responsible for the detection of node failures or crashes. [1] Failure detectors were first introduced in 1996 by Chandra and Toueg in their book Unreliable Failure Detectors for Reliable Distributed Systems.

  3. Burst error-correcting code - Wikipedia

    en.wikipedia.org/wiki/Burst_error-correcting_code

    For achieving this constant speed, rotation of the disc is varied from ~8 rev/s while scanning at the inner portion of the track to ~3.5 rev/s at the outer portion. Pits and lands are the depressions (0.12 μm deep) and flat segments constituting the binary data along the track (0.6 μm width). [8]

  4. Error correction code - Wikipedia

    en.wikipedia.org/wiki/Error_correction_code

    The original information may or may not appear literally in the encoded output; codes that include the unmodified input in the output are systematic, while those that do not are non-systematic. A simplistic example of ECC is to transmit each data bit three times, which is known as a (3,1) repetition code. Through a noisy channel, a receiver ...

  5. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

  6. Race condition - Wikipedia

    en.wikipedia.org/wiki/Race_condition

    When the input value A changes from low to high, the circuit outputs a short spike of duration (∆t 1 + ∆t 2) − ∆t 2 = ∆t 1. A race condition or race hazard is the condition of an electronics , software , or other system where the system's substantive behavior is dependent on the sequence or timing of other uncontrollable events ...

  7. White-box testing - Wikipedia

    en.wikipedia.org/wiki/White-box_testing

    The tester chooses inputs to exercise paths through the code and determine the expected outputs. This is analogous to testing nodes in a circuit, e.g. in-circuit testing (ICT). White-box testing can be applied at the unit, integration and system levels of the software testing process. Although traditional testers tended to think of white-box ...

  8. Network analysis (electrical circuits) - Wikipedia

    en.wikipedia.org/wiki/Network_analysis...

    [2]: 2-8 - 2-9 For all nodes, except a chosen reference node, the node voltage is defined as the voltage drop from the node to the reference node. Therefore, there are N-1 node voltages for a circuit with N nodes. [2]: 2-10 In principle, nodal analysis uses Kirchhoff's current law (KCL) at N-1 nodes to get N-1 independent equations. Since ...

  9. Exposed node problem - Wikipedia

    en.wikipedia.org/wiki/Exposed_node_problem

    When a node hears an RTS from a neighboring node, but not the corresponding CTS, that node can deduce that it is an exposed node and is permitted to transmit to other neighboring nodes. [1] If the nodes are not synchronised (or if the packet sizes are different or the data rates are different) the problem may occur that the sender will not hear ...