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Bragg diffraction (also referred to as the Bragg formulation of X-ray diffraction) was first proposed by Lawrence Bragg and his father, William Henry Bragg, in 1913 [1] after their discovery that crystalline solids produced surprising patterns of reflected X-rays (in contrast to those produced with, for instance, a liquid). They found that ...
William Lawrence Bragg proposed a model where the incoming X-rays are scattered specularly (mirror-like) from each plane; from that assumption, X-rays scattered from adjacent planes will combine constructively (constructive interference) when the angle θ between the plane and the X-ray results in a path-length difference that is an integer ...
1908 - Bernhard Walter and Robert Wichard Pohl observed X-ray diffraction from a slit. [46] [47] 1912 - Max von Laue discovered diffraction patterns from crystals in an x-ray beam. [48] 1912 - Bragg diffraction, expressed through Bragg's law, is first presented by Lawrence Bragg on 11 November 1912 to the Cambridge Philosophical Society. [49]
Ray diagram of Von Laue formulation. In physics, a Bragg plane is a plane in reciprocal space which bisects a reciprocal lattice vector, , at right angles. [1] The Bragg plane is defined as part of the Von Laue condition for diffraction peaks in x-ray diffraction crystallography.
André Authier: Dynamical theory of X-ray diffraction. IUCr monographs on crystallography, no. 11. Oxford University Press (1st edition 2001/ 2nd edition 2003). ISBN 0-19-852892-2. R. W. James: The Optical Principles of the Diffraction of X-rays. Bell., 1948. M. von Laue: Röntgenstrahlinterferenzen. Akademische Verlagsanstalt, 1960 (German).
This means that X-rays are seemingly "reflected" off parallel crystal lattice planes perpendicular at the same angle as their angle of approach to the crystal with respect to the lattice planes; in the elastic light (typically X-ray)-crystal scattering, parallel crystal lattice planes perpendicular to a reciprocal lattice vector for the crystal ...
It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography.
The structure factor is a critical tool in the interpretation of scattering patterns (interference patterns) obtained in X-ray, electron and neutron diffraction experiments. Confusingly, there are two different mathematical expressions in use, both called 'structure factor'.