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In statistics, the Tukey–Duckworth test is a two-sample location test – a statistical test of whether one of two samples was significantly greater than the other. It was introduced by John Tukey, who aimed to answer a request by W. E. Duckworth for a test simple enough to be remembered and applied in the field without recourse to tables, let alone computers.
Tukey's range test, also known as Tukey's test, Tukey method, Tukey's honest significance test, or Tukey's HSD (honestly significant difference) test, [1] is a single-step multiple comparison procedure and statistical test.
John Wilder Tukey (/ ˈ t uː k i / [2]; June 16, 1915 – July 26, 2000) was an American mathematician and statistician, best known for the development of the fast Fourier Transform (FFT) algorithm and box plot. [3] The Tukey range test, the Tukey lambda distribution, the Tukey test of additivity, and the Teichmüller–Tukey lemma all bear
Tukey–Duckworth test: tests equality of two distributions by using ranks. Wald–Wolfowitz runs test: tests whether the elements of a sequence are mutually independent/random. Wilcoxon signed-rank test: tests whether matched pair samples are drawn from populations with different mean ranks.
Tukey's test is either: Tukey's range test, also called Tukey method, Tukey's honest significance test, Tukey's HSD (Honestly Significant Difference) test;
Siegel–Tukey test, named after Sidney Siegel and John Tukey, is a non-parametric test which may be applied to data measured at least on an ordinal scale. It tests for differences in scale between two groups. The test is used to determine if one of two groups of data tends to have more widely dispersed values than the other.
Because the number of means within a range changes with each successive pairwise comparison, the critical value of the q statistic also changes with each comparison, which makes the Neuman-Keuls method more lenient and hence more powerful than Tukey's range test. Thus, if a pairwise comparison was found to be significantly different using the ...
One, the pneumatically-actuated "clamshell" test fixture, electrically probes a circuit board from both sides. The company also combined in-circuit test with functional test in the same test fixture in 2004, by developing (and patenting) the two-stage fixture having pins of two different lengths, and compressing to two different heights. [2]