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  2. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology.Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field.

  3. Lapping - Wikipedia

    en.wikipedia.org/wiki/Lapping

    Surface roughness is defined by the minute variations in height of the surface of a given material or workpiece. The individual variances of the peaks and valleys are averaged (Ra value), or quantified by the largest difference from peak-to-valley (Rz). Roughness is usually expressed in microns. A surface that exhibits an Ra of 8 consists of ...

  4. Surface roughness - Wikipedia

    en.wikipedia.org/wiki/Surface_roughness

    Different capital letters imply that the formula was applied to a different profile. For example, R a {\displaystyle Ra} is the arithmetic average of the roughness profile, P a {\displaystyle Pa} is the arithmetic average of the unfiltered raw profile, and S a {\displaystyle Sa} is the arithmetic average of the 3D roughness.

  5. Micrometre - Wikipedia

    en.wikipedia.org/wiki/Micrometre

    The micrometre (Commonwealth English as used by the International Bureau of Weights and Measures; [1] SI symbol: μm) or micrometer (American English), also commonly known by the non-SI term micron, [2] is a unit of length in the International System of Units (SI) equalling 1 × 10 −6 metre (SI standard prefix "micro-" = 10 −6); that is, one millionth of a metre (or one thousandth of a ...

  6. Fineness modulus - Wikipedia

    en.wikipedia.org/wiki/Fineness_modulus

    The Fineness Modulus (FM) is an empirical figure obtained by adding the total percentage of the sample of an aggregate retained on each of a specified series of sieves, dividing the sum by 100.

  7. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.

  8. Useful conversions and formulas for air dispersion modeling

    en.wikipedia.org/wiki/Useful_conversions_and...

    As an example, given a concentration of 260 mg/m 3 at sea level, calculate the equivalent concentration at an altitude of 1,800 meters: C a = 260 × 0.9877 18 = 208 mg/m 3 at 1,800 meters altitude Standard conditions for gas volumes

  9. Particle-size distribution - Wikipedia

    en.wikipedia.org/wiki/Particle-size_distribution

    It can be measured for any fluid system with no dilution or other sample preparation. This is a big advantage of this method. Calculation of particle size distribution is based on theoretical models that are well verified for up to 50% by volume of dispersed particles on micron and nanometer scales.