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  2. Traction force microscopy - Wikipedia

    en.wikipedia.org/wiki/Traction_force_microscopy

    Confocal fluorescence microscopy is usually employed to image the cell surface and fluorescent beads. After computing the translational displacement field between a deformed and undeformed configuration, a strain field can be calculated by often using a regularization approach, the best of which is the elastic net regularization. [ 8 ]

  3. Colloidal probe technique - Wikipedia

    en.wikipedia.org/wiki/Colloidal_probe_technique

    Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).

  4. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  5. Electrochemical AFM - Wikipedia

    en.wikipedia.org/wiki/Electrochemical_AFM

    Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...

  6. Magnetic force microscope - Wikipedia

    en.wikipedia.org/wiki/Magnetic_force_microscope

    MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...

  7. Nanotribology - Wikipedia

    en.wikipedia.org/wiki/Nanotribology

    [1] [2] [3] Microscopy techniques, including Scanning Tunneling Microscope (STM), Atomic-Force Microscope (AFM) and Surface Forces Apparatus, (SFA) have been used to analyze surfaces with extremely high resolution, while indirect methods such as computational methods [4] and Quartz crystal microbalance (QCM) have also been extensively employed ...

  8. Moral Injury: The Grunts - The Huffington Post

    projects.huffingtonpost.com/moral-injury/the...

    Can we imagine ourselves back on that awful day in the summer of 2010, in the hot firefight that went on for nine hours? Men frenzied with exhaustion and reckless exuberance, eyes and throats burning from dust and smoke, in a battle that erupted after Taliban insurgents castrated a young boy in the village, knowing his family would summon nearby Marines for help and the Marines would come ...

  9. Electrostatic force microscope - Wikipedia

    en.wikipedia.org/wiki/Electrostatic_force_microscope

    Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges.

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