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  2. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.

  3. Scanning Hall probe microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Hall_probe_microscope

    Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.

  4. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  5. Category:Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Category:Scanning_probe...

    This category contains articles about the different types of scanning probe microscopes and methods associated with them. Pages in category "Scanning probe microscopy" The following 49 pages are in this category, out of 49 total.

  6. Atomic force acoustic microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_acoustic...

    AFAM. Atomic force acoustic microscopy (AFAM) is a type of scanning probe microscopy (SPM). It is a combination of acoustics and atomic force microscopy. The principal difference between AFAM and other forms of SPM is the addition of a transducer at the bottom of the sample which induces longitudinal out-of-plane vibrations in the specimen.

  7. Electrochemical AFM - Wikipedia

    en.wikipedia.org/wiki/Electrochemical_AFM

    Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...

  8. Feature-oriented scanning - Wikipedia

    en.wikipedia.org/wiki/Feature-oriented_scanning

    Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features ...

  9. Microscope slide - Wikipedia

    en.wikipedia.org/wiki/Microscope_slide

    A set of standard 75 by 25 mm microscope slides. The white area can be written on to label the slide. A microscope slide (top) and a cover slip (bottom) A microscope slide is a thin flat piece of glass, typically 75 by 26 mm (3 by 1 inches) and about 1 mm thick, used to hold objects for examination under a microscope.

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    scanner hall probe microscopekelvin probe force microscopy