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Idle is a state that a computer processor is in when it is not being used by any program. Every program or task that runs on a computer system occupies a certain amount of processing time on the CPU. If the CPU has completed all tasks it is idle. Modern processors use idle time to save power.
In Windows NT operating systems, the System Idle Process contains one or more kernel threads which run when no other runnable thread can be scheduled on a CPU. In a multiprocessor system, there is one idle thread associated with each CPU core. For a system with hyperthreading enabled, there is an idle thread for each logical processor.
An operating temperature is the allowable temperature range of the local ambient environment at which an electrical or mechanical device operates. The device will operate effectively within a specified temperature range which varies based on the device function and application context, and ranges from the minimum operating temperature to the maximum operating temperature (or peak operating ...
In many applications, the CPU and other components are idle much of the time, so idle power contributes significantly to overall system power usage. When the CPU uses power management features to reduce energy use, other components, such as the motherboard and chipset, take up a larger proportion of the computer's energy.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
ACPI 1.0 (1996) defines a way for a CPU to go to idle "C states", but defines no frequency-scaling system.. ACPI 2.0 (2000) introduces a system of P states (power-performance states) that a processor can use to communicate its possible frequency–power settings to the OS.
The reliability test duration assures the device's adequate lifetime requirement. For example, with an activation energy of 0.7 eV, 125 °C stress temperature and 55 °C use temperature, the acceleration factor (Arrhenius equation) is 78.6. This means that 1,000 hours' stress duration is equivalent to 9 years of use.
Because of this temperature sensitivity, LED measurement standards, like IESNA’s LM-85 Archived 2017-10-18 at the Wayback Machine, require that the junction temperature is determined when making photometric measurements. [5] Junction heating can be minimized in these devices by using the Continuous Pulse Test Method specified in LM-85.