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Raabe–Duhamel's test. Let { an } be a sequence of positive numbers. Define. If. exists there are three possibilities: if L > 1 the series converges (this includes the case L = ∞) if L < 1 the series diverges. and if L = 1 the test is inconclusive. An alternative formulation of this test is as follows.
The pattern may for instance be Convergence in the classical sense to a fixed value, perhaps itself coming from a random event; An increasing similarity of outcomes to what a purely deterministic function would produce; An increasing preference towards a certain outcome; An increasing "aversion" against straying far away from a certain outcome
Definitions. The (reproductive) Tweedie distributions are defined as subfamily of (reproductive) exponential dispersion models (ED), with a special mean - variance relationship. A random variable Y is Tweedie distributed Twp(μ, σ2), if with mean , positive dispersion parameter and where is called the Tweedie power parameter.
Sobol’ sequences (also called LP τ sequences or ( t , s) sequences in base 2) are an example of quasi-random low-discrepancy sequences. They were first introduced by the Russian mathematician Ilya M. Sobol’ (Илья Меерович Соболь) in 1967. [ 1]
Calculus. In mathematics, the ratio test is a test (or "criterion") for the convergence of a series. where each term is a real or complex number and an is nonzero when n is large. The test was first published by Jean le Rond d'Alembert and is sometimes known as d'Alembert's ratio test or as the Cauchy ratio test.
Automatic test pattern generation. ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit ...
A precursor to the SMPTE test pattern was conceived by Norbert D. Larky (1927–2018) [5] [6] and David D. Holmes (1926–2006) [7] [8] of RCA Laboratories and first published in RCA Licensee Bulletin LB-819 on February 7, 1951. U.S. patent 2,742,525 Color Test Pattern Generator (now expired) was awarded on April 17, 1956, to Larky and Holmes. [9]
A digital pattern generator is a source of synchronous digital stimulus; the generated signal is interesting for testing digital electronics at the logic level - this is why they are also called "logic source". A pulse generator is of purpose to generate an electrical pulse of different shapes; they are mostly used for tests at an electrical or ...