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  2. Convergence tests - Wikipedia

    en.wikipedia.org/wiki/Convergence_tests

    Raabe–Duhamel's test. Let { an } be a sequence of positive numbers. Define. If. exists there are three possibilities: if L > 1 the series converges (this includes the case L = ∞) if L < 1 the series diverges. and if L = 1 the test is inconclusive. An alternative formulation of this test is as follows.

  3. SMPTE color bars - Wikipedia

    en.wikipedia.org/wiki/SMPTE_color_bars

    A precursor to the SMPTE test pattern was conceived by Norbert D. Larky (1927–2018) [5] [6] and David D. Holmes (1926–2006) [7] [8] of RCA Laboratories and first published in RCA Licensee Bulletin LB-819 on February 7, 1951. U.S. patent 2,742,525 Color Test Pattern Generator (now expired) was awarded on April 17, 1956, to Larky and Holmes. [9]

  4. Mandelbrot set - Wikipedia

    en.wikipedia.org/wiki/Mandelbrot_set

    The Mandelbrot set ( / ˈmændəlbroʊt, - brɒt /) [ 1][ 2] is a two-dimensional set with a relatively simple definition that exhibits great complexity, especially as it is magnified. It is popular for its aesthetic appeal and fractal structures. The set is defined in the complex plane as the complex numbers for which the function does not ...

  5. Plotting algorithms for the Mandelbrot set - Wikipedia

    en.wikipedia.org/wiki/Plotting_algorithms_for...

    Escape time algorithm. The simplest algorithm for generating a representation of the Mandelbrot set is known as the "escape time" algorithm. A repeating calculation is performed for each x, y point in the plot area and based on the behavior of that calculation, a color is chosen for that pixel.

  6. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    Automatic test pattern generation. ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit ...

  7. Universal Electronic Test Chart - Wikipedia

    en.wikipedia.org/.../Universal_Electronic_Test_Chart

    UEIT - Universal Electronic Test Chart ( russian: УЭИТ - Универсальная электронная испытательная таблица) is a Soviet / Russian test card, designed to test TVs operating in the analogue SECAM colour standard. [ 1][ 2][ 3] UEIT was developed by N. G. Deryugin and V. A. Minaev at the NII Radio ...

  8. Cauchy's convergence test - Wikipedia

    en.wikipedia.org/wiki/Cauchy's_convergence_test

    Cauchy's convergence test. The Cauchy convergence test is a method used to test infinite series for convergence. It relies on bounding sums of terms in the series. This convergence criterion is named after Augustin-Louis Cauchy who published it in his textbook Cours d'Analyse 1821. [1]

  9. Dirichlet's test - Wikipedia

    en.wikipedia.org/wiki/Dirichlet's_test

    An analogous statement for convergence of improper integrals is proven using integration by parts. If the integral of a function f is uniformly bounded over all intervals , and g is a non-negative monotonically decreasing function , then the integral of fg is a convergent improper integral.