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An RF switch or microwave switch is a device to route high frequency signals through transmission paths. RF (radio frequency) and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT). Incorporating a switch into a switch matrix system enables you to route signals ...
Since the signal routing and signal conditioning needs of a test system differ from design to design, RF/Microwave Switch Matrices may be custom designed by the test system engineer or by a hired contractor for each new test system. The Switch Matrix is made up of discrete electronic components including RF switches and signal conditioners that ...
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
The prior art includes an RF MEMS frequency tunable fractal antenna for the 0.1–6 GHz frequency range, [18] and the actual integration of RF MEMS switches on a self-similar Sierpinski gasket antenna to increase its number of resonant frequencies, extending its range to 8 GHz, 14 GHz and 25 GHz, [19] [20] an RF MEMS radiation pattern ...
Integrated circuits (ICs) are generally classified as digital (e.g. a microprocessor) or analog (e.g. an operational amplifier).Mixed-signal ICs contain both digital and analog circuitry on the same chip, and sometimes embedded software.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
Valstar – A digital automated IC test system of up to 1024 pins. This was one of the few testers Credence made from scratch, as opposed to most of the others which were captured through acquisitions. Sapphire – An IC test system intended primarily for production testing with multisite capabilities, i.e., the option to test multiple chips in ...
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.