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Single stuck line is a fault model used in digital circuits. It is used for post manufacturing testing, not design testing. The model assumes one line or node in the digital circuit is stuck at logic high or logic low. When a line is stuck, it is called a fault. Digital circuits can be divided into:
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
A low code-rate close to zero implies a strong code that uses many redundant bits to achieve a good performance, while a large code-rate close to 1 implies a weak code. The redundant bits that protect the information have to be transferred using the same communication resources that they are trying to protect.
Codes with minimum Hamming distance d = 2 are degenerate cases of error-correcting codes and can be used to detect single errors. The parity bit is an example of a single-error-detecting code. The parity bit is an example of a single-error-detecting code.
The parity bit may be used within another constituent code. In an example using the DVB-S2 rate 2/3 code the encoded block size is 64800 symbols (N=64800) with 43200 data bits (K=43200) and 21600 parity bits (M=21600). Each constituent code (check node) encodes 16 data bits except for the first parity bit which encodes 8 data bits.
In a distributed computing system, a failure detector is a computer application or a subsystem that is responsible for the detection of node failures or crashes. [1] Failure detectors were first introduced in 1996 by Chandra and Toueg in their book Unreliable Failure Detectors for Reliable Distributed Systems.
Proof. First we observe that a code can correct all bursts of length if and only if no two codewords differ by the sum of two bursts of length . Suppose that two codewords and differ by bursts and of length each.
In electrical engineering, modified nodal analysis [1] or MNA is an extension of nodal analysis which not only determines the circuit's node voltages (as in classical nodal analysis), but also some branch currents. Modified nodal analysis was developed as a formalism to mitigate the difficulty of representing voltage-defined components in nodal ...