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Reliability of a semiconductor device is the ability of the device to perform its intended function during the life of the device in the field. There are multiple considerations that need to be accounted for when developing reliable semiconductor devices:
The Mil-HDBK-217 reliability calculator manual in combination with RelCalc software (or other comparable tool) enables MTBF reliability rates to be predicted based on design. A concept which is closely related to MTBF, and is important in the computations involving MTBF, is the mean down time (MDT). MDT can be defined as mean time which the ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
Time-dependent gate oxide breakdown (or time-dependent dielectric breakdown, TDDB) is a kind of transistor aging, a failure mechanism in MOSFETs, when the gate oxide breaks down as a result of long-time application of relatively low electric field (as opposed to immediate breakdown, which is caused by strong electric field).
Failure rate is the frequency with which any system or component fails, expressed in failures per unit of time. It thus depends on the system conditions, time interval, and total number of systems under study. [1]
Reliability prediction can be used to size spare populations. Provide necessary input to system-level reliability models. System-level reliability models can subsequently be used to predict, for example, frequency of system outages in steady-state, frequency of system outages during early life, expected downtime per year, and system availability.
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field.
Sherlock also provides design rule checks (DRC) for board-level design (schematic and layout) and an overall reliability score. The reliability scoring, which is provided for the overall products – as well as individual scores and commentary for each area of analysis is used when physics-based quantitative predictions are not possible.