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  2. Reliability (semiconductor) - Wikipedia

    en.wikipedia.org/wiki/Reliability_(semiconductor)

    Reliability of a semiconductor device is the ability of the device to perform its intended function during the life of the device in the field. There are multiple considerations that need to be accounted for when developing reliable semiconductor devices:

  3. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    This method ages all IC's building blocks to allow relevant failure modes to be triggered and implemented in a short reliability experiment. A precise multiplier, known as the Acceleration Factor (AF) simulates long lifetime operation. The AF represents the accelerated aging factor relative to the useful life application conditions.

  4. Time-dependent gate oxide breakdown - Wikipedia

    en.wikipedia.org/wiki/Time-dependent_gate_oxide...

    Time-dependent gate oxide breakdown (or time-dependent dielectric breakdown, TDDB) is a kind of transistor aging, a failure mechanism in MOSFETs, when the gate oxide breaks down as a result of long-time application of relatively low electric field (as opposed to immediate breakdown, which is caused by strong electric field).

  5. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits. Failures most commonly occur near the beginning and near the ending of the lifetime of the parts, resulting in the bathtub curve graph of failure rates.

  6. Negative-bias temperature instability - Wikipedia

    en.wikipedia.org/wiki/Negative-bias_temperature...

    Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs, a type of transistor aging. NBTI manifests as an increase in the threshold voltage and consequent decrease in drain current and transconductance of a MOSFET. The degradation is often approximated by a power-law dependence on time.

  7. Western Digital (WDC) Q1 2025 Earnings Call Transcript - AOL

    www.aol.com/western-digital-wdc-q1-2025...

    Image source: The Motley Fool. Western Digital (NASDAQ: WDC) Q1 2025 Earnings Call Oct 24, 2024, 4:30 p.m. ET. Contents: Prepared Remarks. Questions and Answers. Call Participants

  8. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.

  9. NextEra Energy (NEE) Q4 2024 Earnings Call Transcript - AOL

    www.aol.com/nextera-energy-nee-q4-2024-180014462...

    Image source: The Motley Fool. NextEra Energy (NYSE: NEE) Q4 2024 Earnings Call Jan 24, 2025, 9:00 a.m. ET. Contents: Prepared Remarks. Questions and Answers. Call ...