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While the task of testing a single logic gate at a time sounds simple, there is an obstacle to overcome. For today's highly complex designs, most gates are deeply embedded whereas the test equipment is only connected to the primary Input/outputs (I/Os) and/or some physical test points. The embedded gates, hence, must be manipulated through ...
Depending on the product, the machines that we are referring to could mean a combination of Automatic Test Equipment (ATE), handler, interface board, and test program that drives the ATE, as with the case of the IC chip testing. Test automation is a big part of a test engineer's job. The whole intention of automating the test is as follows:
Digital design focuses on logical correctness, maximizing circuit density, and placing circuits so that clock and timing signals are routed efficiently. Analog IC design also has specializations in power IC design and RF IC design. Analog IC design is used in the design of op-amps, linear regulators, phase locked loops, oscillators and active ...
An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
Constructing an integrated circuit, or any semiconductor device, requires a series of operations—photolithography, etching, metal deposition, and so on.As the industry evolved, each of these operations were typically performed by specialized machines built by a variety of commercial companies.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Electronic design automation is used extensively to ensure that designers do not violate design rules; a process called design rule checking (DRC). DRC is a major step during physical verification signoff on the design, which also involves LVS ( layout versus schematic ) checks, XOR checks, ERC ( electrical rule check ), and antenna checks.