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  2. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    A FIB workstation. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).

  3. TESCAN - Wikipedia

    en.wikipedia.org/wiki/TESCAN

    In 2013, TESCAN ORSAY HOLDING was established following the merger of the Czech company TESCAN, a leading global developer and supplier of scanning electron microscopes (SEMs) and focused ion beam (FIB) workstations, and the French company ORSAY PHYSICS, a world leader in customized Focused Ion Beam and Electron Beam technology. [5]

  4. Colin Sullivan (physician) - Wikipedia

    en.wikipedia.org/wiki/Colin_Sullivan_(physician)

    Colin Sullivan AO FAA is an Australian physician, professor, [1] and inventor known for his invention of the nasal continuous positive airway pressure (CPAP) machine for the treatment of sleep apnea. Sullivan began studying sleep apnea in the late 1970s. In 1981 he published a design for the first CPAP machine in The Lancet. He helped make CPAP ...

  5. Company that made millions of defective sleep apnea machines ...

    www.aol.com/news/company-made-millions-defective...

    The company responsible for a global recall of sleep apnea machines will be barred from resuming production at U.S. facilities until it meets a number of safety requirements, under a long-awaited ...

  6. Does Medicare Cover Inspire for Sleep Apnea? - AOL

    www.aol.com/does-medicare-cover-inspire-sleep...

    If you have obstructive sleep apnea, Original Medicare and Medicare Advantage plans cover medical devices, testing, and treatment your doctor deems medically necessary. For treating sleep apnea ...

  7. Electron beam-induced deposition - Wikipedia

    en.wikipedia.org/wiki/Electron_beam-induced...

    Only SEM-like imaging using secondary electrons is possible, and even that imaging is restricted to short observations due to sample damaging by the Ga + beam. The use of a dual beam instrument, that combines a FIB and an SEM in one, circumvents this limitation. The advantages of IBID are: Much higher deposition rate; Higher purity

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