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  2. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    The distance between two bonded atoms is a sensitive measure of the bond strength and its bond order; thus, X-ray crystallographic studies have led to the discovery of even more exotic types of bonding in inorganic chemistry, such as metal-metal double bonds, [63] [64] [65] metal-metal quadruple bonds, [66] [67] [68] and three-center, two ...

  3. X-ray photoelectron spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_photoelectron...

    X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the very topmost 200 atoms, 0.01 um, 10 nm of any surface. It belongs to the family of photoemission spectroscopies in which electron population spectra are obtained by irradiating a material with a beam of X-rays .

  4. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern.

  5. X-ray fluorescence - Wikipedia

    en.wikipedia.org/wiki/X-ray_fluorescence

    X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...

  6. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    Laboratory X-ray diffraction equipment relies on the use of an X-ray tube, which is used to produce the X-rays. The most commonly used laboratory X-ray tube uses a copper anode, but cobalt and molybdenum are also popular. The wavelength in nm varies for each source. The table below shows these wavelengths, determined by Bearden [14] (all values ...

  7. Electron diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_diffraction

    Close to an aperture or atoms, often called the "sample", the electron wave would be described in terms of near field or Fresnel diffraction. [12]: Chpt 7-8 This has relevance for imaging within electron microscopes, [1]: Chpt 3 [2]: Chpt 3-4 whereas electron diffraction patterns are measured far from the sample, which is described as far-field or Fraunhofer diffraction. [12]:

  8. Structure factor - Wikipedia

    en.wikipedia.org/wiki/Structure_factor

    However, it does reduce the amplitude of the peaks, and due to the factor of in the exponential factor, it reduces peaks at large much more than peaks at small . The structure is simply reduced by a q {\displaystyle q} and disorder dependent term because all disorder of the first-kind does is smear out the scattering planes, effectively ...

  9. Spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Spectroscopy

    Spectral measurement devices are referred to as spectrometers, spectrophotometers, spectrographs or spectral analyzers. Most spectroscopic analysis in the laboratory starts with a sample to be analyzed, then a light source is chosen from any desired range of the light spectrum, then the light goes through the sample to a dispersion array ...

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