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Since 1976, SPEA invents, designs and manufactures the best automatic test equipment for Semiconductor ICs, MEMS, electronic boards and modules. With SPEA testers, semiconductor and electronics manufacturers can ensure, day by day, the quality and reliability of their products.
Since 1976, SPEA designs and manufactures the best automatic test equipment for electronic devices, such as semiconductor wafers, microchips, sensors and MEMS, electronic boards, power modules and batteries for electric vehicles and consumer products.
Complete electronics testing for smartphones, mobile and RF devices, home appliances, telecom networks. In Circuit Testing.
Automatic Test Equipment for every stage in the battery lifecycle. We support battery manufacturers to achieve optimum battery performance through a wide range of automatic testing techniques including Electrical & Hi-Pot, Optical, Thermal, and Geometrical test.
SPEA Automatic Test Equipment analyzes LED light characteristics, enabling lighting product manufacturers to meet industry standards, reduce test time and prevent defects in the field. Talk with an Expert >.
Millions of Energy Meters are tested by SPEA every year with the SPEA Energy Meter Testing Equipment. Start to Test your Smart Meters with SPEA.
SPEA, global leading manufacturer of automatic test equipment for electronics and semiconductors, will present the unique SPEA-branded T100L Automatic LED Light Tester alongside the most pioneering engineering for testing electronic products.
Discover SPEA products forkeyboard and push button testing. SPEA provides test equipment for the automatic keyboard test and calibration and full automatic push buttons test.
The T100L Automatic LED Light Test Equipment is designed to identify the presence of any defects of electronic components for LED light applications, addressing any high-volume production testing challenges without needing expensive test fixtures with fiber optics. Request Demo or Quote. Watch Full Video.
SPEA CT1000 and CT3000 are low-cost test systems dedicated to micro-controllers, RFID, UHF, combi devices. They perform complete, highly accurate measurements, offering high throughput, with high multi-site test capability at wafer test, and a fast data transfer for memory test.