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CDWA Lite is an XML schema created by ARTstor, the J. Paul Getty Trust, and RLG Programs/OCLC to describe core records for works of art and material culture based on CDWA and the Cataloging Cultural Objects (CCO) content standard. The schema was created because of the absence of a data content standard specifically designed for unique cultural ...
The Getty vocabularies can be used in three ways: at the data entry stage, by catalogers or indexers who are describing works of art, architecture, material culture, archival materials, visual surrogates, or bibliographic materials; as knowledge bases, providing information for researchers; and as search assistants to enhance end-user access to online resources. [2]
PLAN test booklets. The PLAN assessment was a preliminary ACT test from ACT, Inc. that was generally administered in the sophomore year. [1] The PLAN test was scored between 1 and 32 and was determined by a composite scoring system much like that of the ACT, based on the scores received on each of the categories of the test.
It is owned by Marathon County and Portage County. [1] It is included in the Federal Aviation Administration (FAA) National Plan of Integrated Airport Systems for 2025–2029, in which it is categorized as a non-hub primary commercial service facility. [3] It is the fifth busiest of eight commercial airports in Wisconsin in terms of passengers ...
Shift-left testing [1] is an approach to software testing and system testing in which testing is performed earlier in the lifecycle (i.e. moved left on the project timeline). It is the first half of the maxim "test early and often". [2] It was coined by Larry Smith in 2001. [3] [4]
The Test and Evaluation Master Plan documents the overall structure and objectives of the Test & Evaluation for a program. [3] It covers activities over a program’s life-cycle and identifies evaluation criteria for the testers. [4] The test and evaluation master plan consists of individual tests. Each test contains the following. Test Scenario
Test coverage in the test plan states what requirements will be verified during what stages of the product life. Test coverage is derived from design specifications and other requirements, such as safety standards or regulatory codes, where each requirement or specification of the design ideally will have one or more corresponding means of verification.
1 Instruction code - indicates the specific command, e.g., "select", "write data" P1-P2 2 Instruction parameters for the command, e.g., offset into file at which to write the data L c: 0, 1 or 3 Encodes the number (N c) of bytes of command data to follow 0 bytes denotes N c =0 1 byte with a value from 1 to 255 denotes N c with the same length