Search results
Results from the WOW.Com Content Network
The FIP standard is based on a French initiative in 1982 to create a requirements analysis for a future field bus standard. The study led to the European Eureka initiative for a field bus standard in June 1986 that included 13 partners. The development group (réseaux locaux industriels) created the first proposal to be standardized in France.
A receptacle tester being used to check for some types of improper wiring of an outlet. For this particular tester, proper wiring is indicated by the two yellow lights. The outlet tester checks that each contact in the outlet appears to be connected to the correct wire in the building's electrical wiring. It can identify several common wiring ...
Multimeter e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital Multimeter) (Measures all of the above) LCR meter - inductance (L), capacitance (C) and resistance (R) meter (measure LCR values) The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator
The types are named with a full name and an abbreviation, such as NPT, NPS, NPTF, or NPSC. MIP is an abbreviation for male iron pipe, and FIP is an abbreviation for female iron pipe. [2] Outside North America, some US pipe thread sizes are widely used, as well as many British Standard Pipe threads and ISO 7–1, 7–2, 228–1, and 228-2 threads.
A test light, test lamp, voltage tester, or mains tester is a piece of electronic test equipment used to determine the presence of electricity in a piece of equipment under test. A test light is simpler and less costly than a measuring instrument such as a multimeter , and often suffices for checking for the presence of voltage on a conductor.
SCPI was defined as an additional layer on top of the IEEE 488.2-1987 specification "Standard Codes, Formats, Protocols, and Common Commands". [4] The standard specifies a common syntax, command structure, and data formats, to be used with all instruments.
A passive oscilloscope probe with a switch in the probe handle that selects 1× or 10× attenuation. To minimize loading, attenuator probes (e.g., 10× probes) are used. A typical probe uses a 9 megohm series resistor shunted by a low-value capacitor to make an RC compensated divider with the cable capacitance and scope input.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.