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AMAT's three parameters hit time (or hit latency), miss rate, and miss penalty provide a quick analysis of memory systems. Hit latency (H) is the time to hit in the cache. Miss rate (MR) is the frequency of cache misses, while average miss penalty (AMP) is the cost of a cache miss in terms of time. Concretely it can be defined as follows.
This ratio can be approximated by, assuming a small AFR, A F R = 8766 M T B F {\displaystyle AFR={8766 \over MTBF}} For example, a common specification for PATA and SATA drives may be an MTBF of 300,000 hours, giving an approximate theoretical 2.92% annualized failure rate i.e. a 2.92% chance that a given drive will fail during a year of use.
Failure rate is the frequency with which any system or component fails, expressed in failures per unit of time. It thus depends on the system conditions, time interval, and total number of systems under study. [1]
The timed test is run on the system, and the time of the test system is compared to the reference time, and a ratio is computed. That ratio becomes the SPEC INT score for that test. (This differs from the rating in SPECINT2000, which multiplies the ratio by 100.)
A concept which is closely related to MTBF, and is important in the computations involving MTBF, is the mean down time (MDT). MDT can be defined as mean time which the system is down after the failure. Usually, MDT is considered different from MTTR (Mean Time To Repair); in particular, MDT usually includes organizational and logistical factors ...
If we ignore both these effects, then the average memory access time becomes an important metric. It provides a measure of the performance of the memory systems and hierarchies. It refers to the average time it takes to perform a memory access. It is the addition of the execution time for the memory instructions and the memory stall cycles.
The time to read the first bit of memory from a DRAM without an active row is T RCD + CL. Row Precharge Time T RP: The minimum number of clock cycles required between issuing the precharge command and opening the next row. The time to read the first bit of memory from a DRAM with the wrong row open is T RP + T RCD + CL. Row Active Time T RAS
A test statistic shares some of the same qualities of a descriptive statistic, and many statistics can be used as both test statistics and descriptive statistics. However, a test statistic is specifically intended for use in statistical testing, whereas the main quality of a descriptive statistic is that it is easily interpretable. Some ...