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  2. Electron mobility - Wikipedia

    en.wikipedia.org/wiki/Electron_mobility

    Therefore mobility is a very important parameter for semiconductor materials. Almost always, higher mobility leads to better device performance, with other things equal. Semiconductor mobility depends on the impurity concentrations (including donor and acceptor concentrations), defect concentration, temperature, and electron and hole ...

  3. Charge carrier density - Wikipedia

    en.wikipedia.org/wiki/Charge_carrier_density

    The carrier density is important for semiconductors, where it is an important quantity for the process of chemical doping.Using band theory, the electron density, is number of electrons per unit volume in the conduction band.

  4. Carrier lifetime - Wikipedia

    en.wikipedia.org/wiki/Carrier_Lifetime

    In semiconductor lasers, the carrier lifetime is the time it takes an electron before recombining via non-radiative processes in the laser cavity. In the frame of the rate equations model , carrier lifetime is used in the charge conservation equation as the time constant of the exponential decay of carriers.

  5. Haynes–Shockley experiment - Wikipedia

    en.wikipedia.org/wiki/Haynes–Shockley_experiment

    In semiconductor physics, the Haynes–Shockley experiment was an experiment that demonstrated that diffusion of minority carriers in a semiconductor could result in a current. The experiment was reported in a short paper by Haynes and Shockley in 1948, [1] with a more detailed version published by Shockley, Pearson, and Haynes in 1949.

  6. Semiconductor characterization techniques - Wikipedia

    en.wikipedia.org/wiki/Semiconductor...

    Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.

  7. Drift current - Wikipedia

    en.wikipedia.org/wiki/Drift_current

    Drift current is the electric current caused by particles getting pulled by an electric field. The term is most commonly used in the context of electrons and holes in semiconductors, although the same concept also applies to metals, electrolytes, and so on.

  8. Transfer length method - Wikipedia

    en.wikipedia.org/wiki/Transfer_length_method

    The goal of the transfer length method (TLM) is the determination of the specific contact resistivity of a metal-semiconductor junction.To create a metal-semiconductor junction a metal film is deposited on the surface of a semiconductor substrate.

  9. Carrier scattering - Wikipedia

    en.wikipedia.org/wiki/Carrier_scattering

    The energy levels of these states are determined by the atoms that make up the solid. Figure 1 shows the Harisson diagram for the elemental semiconductor Si. From left to right, s-orbital and p-orbital hybridization promotes sp 3 bonding which, when multiple sp 3 Si-Si dimers are combined to form a solid, defines the conduction and valence bands.